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Test H: The Instrument Cluster (IC) Does Not Respond To The Scan Tool

PINPOINT TEST H: THE INSTRUMENT CLUSTER (IC) DOES NOT RESPOND TO THE SCAN TOOL

Normal Operation
The instrument cluster (IC) communicates with the scan tool through the high speed controller area network (HS-CAN). Circuits VDB04 (WH/BU) (HS-CAN +) and VDB05 (WH) (HS-CAN -) provide the HS-CAN connection to the IC and circuits VDB06 (GY/OG) (MS-CAN +) and VDB07 (VT/OG) (MS-CAN -) provide the MS-CAN connection to the IC. Voltage for the IC is provided by circuits CBP29 (WH/VT) and SBP26 (YE/RD). Circuit GD115 (BK/GY) provides ground.

The IC shares the HS-CAN with the PCM, the APIM, the ABS module, the 4X4 control module (if equipped), the restraints control module (RCM), the occupant classification system module (OCSM), the headlamp control module (HCM) (if equipped) and the steering angle sensor module (SASM) (if equipped).

The IC shares the MS-CAN with the smart junction box (SJB), the APIM, the HVAC module (if equipped), the audio control module (ACM), the audio digital signal processing (DSP) module (if equipped), the satellite digital audio receiver system (SDARS) module (if equipped), the driver seat module (DSM) (if equipped), the dual climate control seat module (DCSM) (if equipped), the liftgate/trunk module (LTM) (if equipped), the parking aid module (PAM) (if equipped), and the rear entertainment module (RETM) (if equipped).

This pinpoint test is intended to diagnose the following:
- Fuse
- Wiring, terminals or connectors
- IC


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