Test C: The Instrument Cluster (IC) Does Not Respond To The Scan Tool

PINPOINT TEST C: THE INSTRUMENT CLUSTER (IC) DOES NOT RESPOND TO THE SCAN TOOL

Normal Operation
The instrument cluster (IC) communicates with the scan tool through the high speed controller area network (HS-CAN). Circuits 1827 (WH/LG) (HS-CAN +) and 1828 (PK/LG) (HS-CAN -) provide the HS-CAN connection to the IC and circuits 1847 (WH/OG) (MS-CAN +) and 1848 (PK/OG) (MS-CAN -) provide the MS-CAN connection to the IC. The IC shares the HS-CAN with the PCM, and the ABS module (if equipped). Voltage for the IC is provided by circuits 489 (PK/BK), 1001 (LG/RD) and 1266 (RD/YE). Circuit 1205 (BK) provides ground.

This pinpoint test is intended to diagnose the following:
- Fuse
- Wiring, terminals or connectors
- IC

C1-C2:

C3-C4:

C5: